ISO 19683:2017 defines test methods and requirements for design, qualification and acceptance of small spacecraft modules. The minimum test requirements and qualification test methods for the design and manufacturing methods of commercial small satellite hardware are defined in this standard. The different small satellite categories will be defined clearly in this document. It assures the reliability against failure rates generated by the manufacturing of the product. Low cost and fast delivery are handled as key factors. This document is applicable only for small satellites which require adequate processes than bigger satellites. The detailed content of this standard is defined below:
Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Abbreviated terms
5 General requirements
5.1 Tailoring
5.2 Qualification test
5.3 Acceptance test
5.4 Proto-flight test
5.5 Retest
5.6 Test documentation
5.6.1 Test plan, specification and procedure
5.6.2 Test report
5.6.3 Datasheet for unit test results
5.7 Test conditions, tolerances and accuracies
5.8 Functional test
5.9 Design, verification and testing philosophy
6 Satellite system tests
6.1 Test items
6.2 Test level and duration
7 Unit tests
7.1 Test items
7.2 Test levels and duration
8 Test requirements
8.1 Electrical interface
8.1.1 Purpose of test
8.1.2 Test facilities and setup as basic requirements
8.1.3 Test article configuration
8.1.4 Monitoring during test
8.1.5 Test levels and duration
8.1.6 Test conditions and guidelines
8.2 Functional test
8.2.1 Purpose of test
8.2.2 Test facilities and setup as basic requirements
8.2.3 Test article configuration
8.2.4 Monitoring during test
8.2.5 Test levels and duration
8.2.6 Test conditions and guidelines
8.3 Mission test
8.3.1 Purpose of test
8.3.2 Test facilities and setup as basic requirements
8.3.3 Test article configuration
8.3.4 Monitoring during test
8.3.5 Test levels and duration
8.3.6 Test conditions and guidelines
8.4 Total Ionization Dose (TID) test
8.4.1 Purpose of test
8.4.2 Test facilities and setup as basic requirements
8.4.3 Test article configuration
8.4.4 Monitoring during test
8.4.5 Test levels and duration
8.4.6 Test conditions and guidelines
8.5 Single Event Effect (SEE) test
8.5.1 Purpose of test
8.5.2 Test facilities and setup as basic requirements
8.5.3 Test article configuration
8.5.4 Monitoring during test
8.5.5 Test levels and duration
8.5.6 Test conditions and guidelines
8.5.7 Test conditions and guidelines
8.6 Spacecraft Charging Induced Electrostatic Discharge (ESD) test
8.6.1 Purpose of test
8.6.2 Test facilities and setup as basic requirements
8.6.3 Test article configuration
8.6.4 Monitoring during test
8.6.5 Test levels and duration
8.6.6 Test conditions and guidelines
8.7 Electromagnetic Compatibility (EMC) test
8.7.1 Purpose of test
8.7.2 Test facilities and setup as basic requirements
8.7.3 Test article configuration
8.7.4 Monitoring during test
8.7.5 Test levels and duration
8.7.6 Test conditions and guidelines
8.8 Deployment test
8.8.1 Purpose of test
8.8.2 Test facilities and setup as basic requirements
8.8.3 Test article configuration
8.8.4 Monitoring during test
8.8.5 Test levels and duration
8.8.6 Test conditions and guidelines
8.9 Magnetic field test
8.10 Antenna pattern test
8.11 Alignment measurement
8.12 Physical property measurement
8.13 Launcher/Spacecraft interface test
8.14 Quasi-static load test
8.14.1 Purpose of test
8.14.2 Test facilities and setup as basic requirements
8.14.3 Test article configuration
8.14.4 Monitoring during test
8.14.5 Test levels and duration
8.14.6 Test conditions and guidelines
8.15 Modal survey
8.15.1 Purpose of test
8.15.2 Test facilities and setup as basic requirements
8.15.3 Test article configuration
8.15.4 Monitoring during test
8.15.5 Test levels and duration
8.15.6 Test conditions and guidelines
8.16 Sinusoidal vibration test
8.16.1 Purpose of test
8.16.2 Test facilities and setup as basic requirements
8.16.3 Test article configuration
8.16.4 Monitoring during test
8.16.5 Test levels and duration
8.16.6 Test conditions and guidelines
8.17 Random vibration test
8.17.1 Purpose of test
8.17.2 Test facilities and setup as basic requirements
8.17.3 Test article configuration
8.17.4 Monitoring during test
8.17.5 Test levels and duration
8.17.6 Test conditions and guidelines
8.18 Acoustic test
8.18.1 Purpose of test
8.18.2 Test facilities and setup as basic requirements
8.18.3 Test article configuration
8.18.4 Monitoring during test
8.18.5 Test levels and duration
8.18.6 Test conditions and guidelines
8.19 Shock test
8.19.1 Purpose of test
8.19.2 Test facilities and setup as basic requirements
8.19.3 Test article configuration
8.19.4 Monitoring during test
8.19.5 Test levels and duration
8.19.6 Test conditions and guidelines
8.20 Thermal balance test
8.20.1 Purpose of test
8.20.2 Test facilities and setup as basic requirements
8.20.3 Test article configuration
8.20.4 Monitoring during test
8.20.5 Test levels and duration
8.20.6 Test conditions and guidelines
8.21 Thermal vacuum test
8.21.1 Purpose of test
8.21.2 Test facilities and setup as basic requirements
8.21.3 Test article configuration
8.21.4 Monitoring during test
8.21.5 Test levels and duration
8.21.6 Test conditions and guidelines
8.22 Functional test in vacuum
8.22.1 Purpose of test
8.22.2 Test facilities and setup as basic requirements
8.22.3 Test article configuration
8.22.4 Monitoring during test
8.22.5 Test levels and duration
8.22.6 Test conditions and guidelines
8.23 Cold/Hot start test
8.23.1 Purpose of test
8.23.2 Test facilities and setup as basic requirements
8.23.3 Test article configuration
8.23.4 Monitoring during test
8.23.5 Test levels and duration
8.23.6 Test conditions and guidelines
8.24 Thermal cycle functional test
8.24.1 Purpose of test
8.24.2 Test facilities and setup as basic requirements
8.24.3 Test article configuration
8.24.4 Monitoring during test
8.24.5 Test levels and duration
8.24.6 Test conditions and guidelines
8.25 Thermal cycle endurance test
8.25.1 Purpose of test
8.25.2 Test facilities and setup as basic requirements
8.25.3 Test article configuration
8.25.4 Monitoring during test
8.25.5 Test levels and duration
8.25.6 Test conditions and guidelines
8.26 Pressure test
8.27 Leakage test
8.28 Microvibration test
8.28.1 Purpose of test
8.28.2 Test facilities and setup as basic requirements
8.28.3 Test article configuration
8.28.4 Monitoring during test
8.28.5 Test levels and duration
8.28.6 Test conditions and guidelines
8.29 Burn-in and wear-in test
8.30 End-to-end mission simulation
8.31 Bake out and outgas test
8.32 Tailoring and waiver guides
Annex A Tailoring and waiver guides
A.1 Mission test
A.2 Total Ionization Dose (TID) test
A.3 Single Event Effect (SEE) test
A.4 Spacecraft Charging Induced Electrostatic Discharge (ESD) test
A.5 Electromagnetic Compatibility (EMC) test
A.6 Deployment test
A.7 Quasi-static load test
A.8 Modal survey
A.9 Sinusoidal vibration test
A.10 Random vibration test
A.11 Acoustic test
A.12 Shock test
A.13 Thermal balance test
A.14 Thermal vacuum test
A.15 Functional test in vacuum
A.16 Cold/Hot start test
A.17 Thermal cycle functional test
A.18 Thermal cycle endurance test
A.19 Microvibration test
A.20 Bake out and outgas test
Annex B Basis of test levels and duration
B.1 Radiation
B.2 Thermal
B.3 Mechanical
Annex C Design, verification and testing philosophy for small spacecrafts
C.1 COTS
C.2 Design
C.3 Verification
C.4 Testing
C.5 Small spacecraft program/design characteristics and verification strategy
C.6 Testing strategy
Annex D Test selection logic flow
Annex E Environment stress screening and burn-in
Annex F Thermal vacuum or thermal cycle?
